瀏覽 的方式： 作者 Su, David
顯示 1 到 2 筆資料，總共 2 筆
| 公開日期 | 標題 | 作者 |
| 21-九月-2009 | Application of secondary electron potential contrast on junction leakage isolation | Liu, Po-Tsun; Lee, Jeng-Han; Huan, Y. S.; Su, David; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display |
| 1-一月-2012 | Surface Potential and Electric Field Mapping of p-well/n-well Junction by Secondary Electron Potential Contrast and in-situ Nanoprobe biasing | Lee, Jeng-Han; Liu, Po-Tsun; Wang, M. H.; Lin, Y. T.; Huan, Y. S.; Su, David; 顯示科技研究所; Institute of Display |
