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Browsing by Author Su, FC
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Showing results 1 to 8 of 8
Issue Date
Title
Author(s)
1-Jul-2000
An effective method for evaluating the image-sticking effect of TFT-LCDs by interpretative modelling of optical measurements
Chen, PL
;
Chen, SH
;
Su, FC
;
光電工程學系
;
Department of Photonics
1-Jun-1996
Effects of the rear interface states and fixed charges on the electrical characteristics of thin film transistors with thin amorphous silicon layers
Tai, YH
;
Su, FC
;
Feng, MS
;
Cheng, HC
;
材料科學與工程學系
;
電子工程學系及電子研究所
;
Department of Materials Science and Engineering
;
Department of Electronics Engineering and Institute of Electronics
1-Aug-1997
The electrical characteristics of the amorphous silicon thin film transistors with dual intrinsic layers
Tsai, JW
;
Cheng, HC
;
Chou, A
;
Su, FC
;
Luo, FC
;
Tuan, HC
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-May-1996
Electrical properties of amorphous silicon films with different thicknesses in metal/insulator/semiconductor structures
Tai, YH
;
Su, FC
;
Chang, WS
;
Feng, MS
;
Cheng, HC
;
材料科學與工程學系
;
電子工程學系及電子研究所
;
Department of Materials Science and Engineering
;
Department of Electronics Engineering and Institute of Electronics
23-Feb-2005
Fault diagnosis of rotating machinery using an intelligent order tracking system
Bai, MS
;
Huang, JM
;
Hong, MH
;
Su, FC
;
機械工程學系
;
Department of Mechanical Engineering
1995
Process-related instability mechanisms for the hydrogenated amorphous silicon thin film transistors
Tai, YH
;
Su, FC
;
Feng, MS
;
Cheng, HC
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-Sep-1997
Reducing threshold voltage shifts in amorphous silicon thin film transistors by hydrogenating the gate nitride prior to amorphous silicon deposition
Tsai, JW
;
Huang, CY
;
Tai, YH
;
Cheng, HC
;
Su, FC
;
Luo, FC
;
Tuan, HC
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-Sep-1997
Reducing threshold voltage shifts in amorphous silicon thin film transistors by hydrogenating the gate nitride prior to amorphous silicon deposition
Tsai, JW
;
Huang, CY
;
Tai, YH
;
Cheng, HC
;
Su, FC
;
Luo, FC
;
Tuan, HC
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics