瀏覽 的方式： 作者 Su, FC
顯示 1 到 8 筆資料，總共 8 筆
| 公開日期 | 標題 | 作者 |
| 1-七月-2000 | An effective method for evaluating the image-sticking effect of TFT-LCDs by interpretative modelling of optical measurements | Chen, PL; Chen, SH; Su, FC; 光電工程學系; Department of Photonics |
| 1-六月-1996 | Effects of the rear interface states and fixed charges on the electrical characteristics of thin film transistors with thin amorphous silicon layers | Tai, YH; Su, FC; Feng, MS; Cheng, HC; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics |
| 1-八月-1997 | The electrical characteristics of the amorphous silicon thin film transistors with dual intrinsic layers | Tsai, JW; Cheng, HC; Chou, A; Su, FC; Luo, FC; Tuan, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-五月-1996 | Electrical properties of amorphous silicon films with different thicknesses in metal/insulator/semiconductor structures | Tai, YH; Su, FC; Chang, WS; Feng, MS; Cheng, HC; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics |
| 23-二月-2005 | Fault diagnosis of rotating machinery using an intelligent order tracking system | Bai, MS; Huang, JM; Hong, MH; Su, FC; 機械工程學系; Department of Mechanical Engineering |
| 1995 | Process-related instability mechanisms for the hydrogenated amorphous silicon thin film transistors | Tai, YH; Su, FC; Feng, MS; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-九月-1997 | Reducing threshold voltage shifts in amorphous silicon thin film transistors by hydrogenating the gate nitride prior to amorphous silicon deposition | Tsai, JW; Huang, CY; Tai, YH; Cheng, HC; Su, FC; Luo, FC; Tuan, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-九月-1997 | Reducing threshold voltage shifts in amorphous silicon thin film transistors by hydrogenating the gate nitride prior to amorphous silicon deposition | Tsai, JW; Huang, CY; Tai, YH; Cheng, HC; Su, FC; Luo, FC; Tuan, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
