瀏覽 的方式： 作者 Su, HD
顯示 1 到 4 筆資料，總共 4 筆
| 公開日期 | 標題 | 作者 |
| 1-十二月-2003 | Bi-mode breakdown test methodology of ultrathin oxide | Su, HD; Chiou, BS; Ko, CY; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Chao, CP; See, YC; Sun, JYC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-九月-2003 | Characteristics of oxide breakdown and related impact on device of ultrathin (2.2 nm) silicon dioxide | Su, HD; Chiou, BS; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Cha, CP; See, YC; Sun, JYC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-六月-2003 | A floating well method for exact capacitance-voltage measurement of nano technology | Su, HD; Chiou, BS; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Chao, CP; See, YC; Sun, JYC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-一月-2002 | Novel chip standby current prediction model and ultrathin gate oxide scaling limit | Su, HD; Chiou, BS; Lu, PC; Chang, MH; Lee, KH; Chao, CP; See, YC; Sung, JYC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
