Skip navigation
Browse
Items
Issue Date
Author
Title
Subject
Researchers
English
繁體
简体
You are Here:
National Chiao Tung University Institutional Repository
Browsing by Author Su, Ping-Hsun
Jump to:
0-9
A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Z
or enter first few letters:
Sort by:
title
issue date
submit date
In order:
Ascending
Descending
Results/Page
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
Authors/Record:
All
1
5
10
15
20
25
30
35
40
45
50
Showing results 1 to 9 of 9
Issue Date
Title
Author(s)
1-Mar-2018
Analysis of In-Line Process Parameters of the Unity Gain Frequency of HKMG Bulk FinFET Devices
Su, Ping-Hsun
;
Li, Yiming
;
電機工程學系
;
Department of Electrical and Computer Engineering
1-Jan-2014
Design Optimization of 16-nm Bulk FinFET Technology via Geometric Programming
Su, Ping-Hsun
;
Li, Yiming
;
傳播研究所
;
Institute of Communication Studies
1-May-2015
Determination of Source-and-Drain Series Resistance in 16-nm-Gate FinFET Devices
Su, Ping-Hsun
;
Li, Yiming
;
電信工程研究所
;
Institute of Communications Engineering
Jun-2016
Exploration of Inter-Die Bulk Fin-Typed Field Effect Transistor Process Variation for Reduction of Device Variability
Su, Ping-Hsun
;
Li, Yiming
;
交大名義發表
;
傳播研究所
;
電機學院
;
National Chiao Tung University
;
Institute of Communication Studies
;
College of Electrical and Computer Engineering
1-Feb-2017
Impacts of plasma-induced damage due to UV light irradiation during etching on Ge fin fabrication and device performance of Ge fin field-effect transistors
Mizubayashi, Wataru
;
Noda, Shuichi
;
Ishikawa, Yuki
;
Nishi, Takashi
;
Kikuchi, Akio
;
Ota, Hiroyuki
;
Su, Ping-Hsun
;
Li, Yiming
;
Samukawa, Seiji
;
Endo, Kazuhiko
;
交大名義發表
;
National Chiao Tung University
2016
Process Technological Analysis for Dynamic Characteristic Improvement of 16-nm HKMG Bulk FinFET CMOS Circuits
Su, Ping-Hsun
;
Li, Yiming
;
電信工程研究所
;
Institute of Communications Engineering
Aug-2016
Process-Dependence Analysis for Characteristic Improvement of Ring Oscillator Using 16-nm Bulk FinFET Devices
Su, Ping-Hsun
;
Li, Yiming
;
電信工程研究所
;
Institute of Communications Engineering
1-May-2015
Source/Drain Series Resistance Extraction in HKMG Multifin Bulk FinFET Devices
Su, Ping-Hsun
;
Li, Yiming
;
電機資訊學士班
;
Undergraduate Honors Program of Electrical Engineering and Computer Science
Aug-2016
A Systematic Approach to Correlation Analysis of In-Line Process Parameters for Process Variation Effect on Electrical Characteristic of 16-nm HKMG Bulk FinFET Devices
Su, Ping-Hsun
;
Li, Yiming
;
電信工程研究所
;
Institute of Communications Engineering