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Browsing by Author Sung, Wen-Li
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Showing results 1 to 6 of 6
Issue Date
Title
Author(s)
1-Jan-2017
Asymmetric Characteristic Fluctuation of Undoped Gate-All-Around Nanowire MOSFETs Induced by Random Discrete Dopants inside Source/Drain Extensions
Sung, Wen-Li
;
Li, Yiming
;
資訊工程學系
;
電機工程學系
;
電信工程研究所
;
Department of Computer Science
;
Department of Electrical and Computer Engineering
;
Institute of Communications Engineering
1-Jun-2018
DC/AC/RF Characteristic Fluctuations Induced by Various Random Discrete Dopants of Gate-All-Around Silicon Nanowire n-MOSFETs
Sung, Wen-Li
;
Li, Yiming
;
電信工程研究所
;
Institute of Communications Engineering
1-Jan-1970
Effects of random number and location of the nanosized metal grains on the threshold voltage variability of silicon gate-all-around nanowiren-type metal-oxide-semiconductor field-effect transistors
Sung, Wen-Li
;
Li, Yiming
;
交大名義發表
;
電機工程學系
;
電信工程研究所
;
National Chiao Tung University
;
Department of Electrical and Computer Engineering
;
Institute of Communications Engineering
2016
Statistical Device Simulation of Characteristic Fluctuation of 10-nm Gate-All-Around Silicon Nanowire MOSFETs Induced by Various Discrete Random Dopants
Sung, Wen-Li
;
Chang, Han-Tung
;
Chen, Chieh-Yang
;
Chao, Pei-Jung
;
Li, Yiming
;
分子醫學與生物工程研究所
;
電機工程學系
;
電信工程研究所
;
Institute of Molecular Medicine and Bioengineering
;
Department of Electrical and Computer Engineering
;
Institute of Communications Engineering
1-Jan-1970
Statistical Prediction of Nanosized-Metal-Grain-Induced Threshold-Voltage Variability for 3D Vertically Stacked Silicon Gate-All-Around Nanowiren-MOSFETs
Sung, Wen-Li
;
Li, Yiming
;
交大名義發表
;
電機工程學系
;
電信工程研究所
;
National Chiao Tung University
;
Department of Electrical and Computer Engineering
;
Institute of Communications Engineering
1-Jan-2017
Timing and Power Fluctuations on Gate-All-Around Nanowire CMOS Circuit Induced by Various Sources of Random Discrete Dopants
Sung, Wen-Li
;
Chao, Pei-Jung
;
Li, Yiming
;
分子醫學與生物工程研究所
;
電信工程研究所
;
Institute of Molecular Medicine and Bioengineering
;
Institute of Communications Engineering