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Browsing by Author Syu, Yi-Jhen
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Showing results 1 to 1 of 1
Issue Date
Title
Author(s)
2015
Reliability Analysis of Amorphous Silicon Thin-Film Transistors during Accelerated ESD Stress
Tsai, Jung-Ruey
;
Wen, Ting-Ting
;
Yang, Shao-Ming
;
Sheu, Gene
;
Chang, Ruey-Dar
;
Syu, Yi-Jhen
;
Liu, Chin-Ping
;
Chang, Hsiu-Fu
;
Wei, Zhao-Hui
;
奈米中心
;
Nano Facility Center
