瀏覽 的方式： 作者 Teng, TH
顯示 1 到 6 筆資料，總共 6 筆
| 公開日期 | 標題 | 作者 |
| 1-八月-2002 | Degradation of passivated and non-passivated N-channel low-temperature polycrystalline silicon TFTs prepared by excimer laser processing | Teng, TH; Huang, CY; Chang, TK; Lin, CW; Cheng, LJ; Lu, YL; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-四月-2001 | Effect of temperature and illumination on the instability of a-Si : H thin-film transistors under AC gate bias stress | Huang, CY; Teng, TH; Yang, CJ; Tseng, CH; Cheng, HC; 奈米中心; Nano Facility Center |
| 2000 | Effect of TiN treated by rapid thermal annealing on properties of BST capacitors prepared by RF magnetron co-sputter system at low substrate temperature | Teng, TH; Hwang, CC; Lai, MJ; Huang, SC; Chen, JS; Jaing, CC; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-七月-2000 | The instability mechanisms of hydrogenated amorphous silicon thin film transistors under AC bias stress | Huang, CY; Teng, TH; Tsai, JW; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-八月-2002 | Study on dopant activation of phosphorous implanted polycrystalline silicon thin films by KrF excimer laser annealing | Tseng, CH; Lin, CW; Teng, TH; Chang, TK; Cheng, HC; Chin, A; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-十月-2000 | Turnaround phenomenon of threshold voltage shifts in amorphous silicon thin film transistors under negative bias stress | Huang, CY; Tsai, JW; Teng, TH; Yang, CJ; Cheng, HC; 奈米中心; Nano Facility Center |
