瀏覽 的方式： 作者 WEI, CS
顯示 1 到 5 筆資料，總共 5 筆
| 公開日期 | 標題 | 作者 |
| 1994 | CHARACTERIZATION OF A HIGH-QUALITY AND UV-TRANSPARENT PECVD SILICON-NITRIDE FILM FOR NONVOLATILE MEMORY APPLICATIONS | WANG, CK; YING, TL; WEI, CS; LIU, LM; CHENG, HC; LIN, MS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-九月-1995 | ELLIPSOMETRIC MEASUREMENTS AND ITS ALIGNMENT - USING THE INTENSITY RATIO TECHNIQUE | CHAO, YF; WEI, CS; LEE, WC; LIN, SC; CHAO, TS; 交大名義發表; National Chiao Tung University |
| 1994 | THE ELLIPSOMETRIC MEASUREMENTS ON SIO2 BY INTENSITY RATIO TECHNIQUE | CHAO, YF; WEI, CS; LEE, WC; LIN, SC; 交大名義發表; National Chiao Tung University |
| 1-九月-1995 | INVESTIGATION OF A HIGH-QUALITY AND ULTRAVIOLET-LIGHT TRANSPARENT PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION SILICON-NITRIDE FILM FOR NONVOLATILE MEMORY APPLICATION | WANG, CK; YING, TL; WEI, CS; LIU, LM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-九月-1995 | INVESTIGATION OF A HIGH-QUALITY AND ULTRAVIOLET-LIGHT TRANSPARENT PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION SILICON-NITRIDE FILM FOR NONVOLATILE MEMORY APPLICATION | WANG, CK; YING, TL; WEI, CS; LIU, LM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
