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Issue DateTitleAuthor(s)
1-Apr-2006Applications of the Web-based collaborative visualization in distributed product developmentChu, CH; Cheng, CY; Wu, CW; 資訊工程學系; Department of Computer Science
16-Sep-2005A Bayesian approach for assessing process precision based on multiple samplesPearn, WL; Wu, CW; 工業工程與管理學系; Department of Industrial Engineering and Management
2005Bootstrap approach for estimating process quality yield with application to light emitting diodesPearn, WL; Chang, YC; Wu, CW; 工業工程與管理學系; Department of Industrial Engineering and Management
2005Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufacturingPearn, WL; Wu, CW; Wang, KH; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Feb-2005Capability testing based on CPM with multiple samplesWu, CW; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Jan-2006Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of detectivesPearn, WL; Wu, CW; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Nov-2004Distributional and inferential properties of the process loss indicesPearn, WL; Chang, YC; Wu, CW; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Jul-2000Effects of a new combination of additives in electroplating solution on the properties of Cu films in ULSI applicationsHu, JC; Chang, TC; Wu, CW; Chen, LJ; Hsiung, CS; Hsieh, WY; Lur, W; Yew, TR; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
25-May-2006Extrusion analysis and workability prediction of three-layer composite hexagonal clad rodsWu, CW; Hsu, RQ; 機械工程學系; Department of Mechanical Engineering
10-Apr-2002Extrusion of three-layer composite hexagonal clad rodsWu, CW; Hsu, RQ; 機械工程學系; Department of Mechanical Engineering
2005Measuring manufacturing capability for couplers and wavelength division multiplexersWu, CW; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Jul-2004Procedure for supplier selection based on C-pm applied to super twisted nematic liquid crystal display processesPearn, WL; Wu, CW; Lin, HC; 工業工程與管理學系; Department of Industrial Engineering and Management
2005Procedures for testing manufacturing precision C(p)based on ((X)over-bar, R) or ((X)over-bar, S) control chart samplesPearn, WL; Wu, CW; Chuang, HC; 工業工程與管理學系; Department of Industrial Engineering and Management
2005Process capabitity assessment for index C-pk based on bayesian approachPearn, WL; Wu, CW; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Sep-2006Production quality and yield assurance for processes with multiple independent characteristicsPearn, WL; Wu, CW; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Aug-2006Quality yield measure for processes with asymmetric tolerancesPearn, WL; Lin, PC; Chang, YC; Wu, CW; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Dec-2004Quality-yield measure for production processes with very low fraction defectivePearn, WL; Chang, YC; Wu, CW; 工業工程與管理學系; Department of Industrial Engineering and Management
2004A Sigma-Delta modulation based analog BIST system with a wide bandwidth fifth-order analog response extractor for diagnosis purposeHong, HC; Wu, CW; Cheng, KT; 電控工程研究所; Institute of Electrical and Control Engineering
2-Jun-2000The syntheses of pyrazino-containing sultines and their application in Diels-Alder reactions with electron-poor olefins and [60]fullereneLiu, JH; Wu, AT; Huang, MH; Wu, CW; Chung, WS; 應用化學系; Department of Applied Chemistry
1-Mar-2000Theoretical analysis of extrusion of rectangular, hexagonal and octagonal composite clad rodsWu, CW; Hsu, RQ; 機械工程學系; Department of Mechanical Engineering
Showing results 1 to 20 of 23  next >