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Browsing by Author Wu, P. C.
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Showing results 1 to 2 of 2
Issue Date
Title
Author(s)
1-Jan-2014
The Observation of BTI-induced RTN Traps in Inversion and Accumulation Modes on HfO2 High-k Metal Gate 28nm CMOS Devices
Wu, P. C.
;
Hsieh, E. R.
;
Lu, P. Y.
;
Chung, Steve S.
;
Chang, K. Y.
;
Liu, C. H.
;
Ke, J. C.
;
Yang, C. W.
;
Tsai, C. T.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2013
The Understanding of the Bulk Trigate MOSFET's Reliability Through the Manipulation of RTN Traps
Hsieh, E. R.
;
Wu, P. C.
;
Chung, Steve S.
;
Tsai, C. H.
;
Huang, R. M.
;
Tsai, C. T.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
