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Showing results 1 to 3 of 3
Issue Date
Title
Author(s)
2004
Characterization on ESD devices with test structures in silicon germanium RF BiCMOS process
Ker, MD
;
Wu, WL
;
Chang, CY
;
電機學院
;
College of Electrical and Computer Engineering
1-May-2006
New construction for transversal design
Du, DZ
;
Hwang, FK
;
Wu, WL
;
Znati, T
;
應用數學系
;
Department of Applied Mathematics
1-Oct-2001
X-ray reflectivity and FTIR measurements of N-2 plasma effects on the density profile of hydrogen silsesquioxane thin films
Lee, HJ
;
Lin, EK
;
Wu, WL
;
Fanconi, BM
;
Lan, JK
;
Cheng, YL
;
Liou, HC
;
Wang, YL
;
Feng, MS
;
Chao, CG
;
交大名義發表
;
National Chiao Tung University