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Browsing by Author Wu, Wang-Tsung

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Showing results 1 to 10 of 10
Issue DateTitleAuthor(s)
1-Dec-2010An alternative bend-testing technique for a flexible indium tin oxide filmChen, Yen-Liang; Hsieh, Hung-Chih; Wu, Wang-Tsung; Wen, Bor-Jiunn; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics
20-Dec-2010Alternative method for measuring the full-field refractive index of a gradient-index lens with normal incidence heterodyne interferometryChen, Yen-Liang; Hsieh, Hung-Chih; Wu, Wang-Tsung; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics
1-Oct-2010Full-field refractive index distribution measurement of a gradient-index lens with heterodyne interferometryHsieh, Hung-Chih; Chen, Yen-Liang; Wu, Wang-Tsung; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics
1-Oct-2010Full-field refractive index distribution measurement of a gradient-index lens with heterodyne interferometryHsieh, Hung-Chih; Chen, Yen-Liang; Wu, Wang-Tsung; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; 光電工程研究所; Department of Photonics; Institute of EO Enginerring
20-Jul-2011High-accuracy thickness measurement of a transparent plate with the heterodyne central fringe identification techniqueWu, Wang-Tsung; Hsieh, Hung-Chih; Chang, Wei-Yao; Chen, Yen-Liang; Su, Der-Chin; 光電工程學系; Department of Photonics
1-Jun-2010Method for gauge block measurement with the heterodyne central fringe identification techniqueWu, Wang-Tsung; Chen, Yen-Liang; Hsieh, Hung-Chih; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics
1-Dec-2008Nano-roughness measurements with a modified Linnik microscope and the uses of full-field heterodyne interferometryChen, Yen-Liang; Jian, Zhi-Cheng; Hsieh, Hung-Chih; Wu, Wang-Tsung; Su, Der-Chin; 光電工程學系; Department of Photonics
1-Apr-2011Optimal sampling conditions for a commonly used charge-coupled device camera in the full-field heterodyne interferometryHsieh, Hung-Chih; Wu, Wang-Tsung; Chang, Wei-Yao; Chen, Yen-Liang; Su, Der-Chin; 光電工程學系; Department of Photonics
1-Feb-2009Two-wavelength full-field heterodyne interferometric profilometryHsieh, Hung-Chih; Chen, Yen-Liang; Jian, Zhi-Chen; Wu, Wang-Tsung; Su, Der-Chin; 光電工程學系; Department of Photonics
2011外差干涉術在中央條紋法的應用與誤差分析吳旺聰; Wu, Wang-Tsung; 蘇德欽; Su, Der-Chin; 光電工程學系
Showing results 1 to 10 of 10