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Showing results 1 to 5 of 5
Issue DateTitleAuthor(s)
1-Aug-1999A dopant-related defect in Te-doped AlInPWu, YR; Sung, WJ; Wen, TC; Lee, SC; Lee, WI; 電子物理學系; 友訊交大聯合研發中心; Department of Electrophysics; D Link NCTU Joint Res Ctr
1-Sep-2001Gamma-ray induced deep electron traps in GaInPSung, WJ; Liu, TY; Yang, SL; Huang, KF; Tseng, TY; Chou, FI; Wei, YY; Wu, YR; 電子物理學系; Department of Electrophysics
11-Jan-1999Majority- and minority-carrier traps in Te-doped AlInPWu, YR; Sung, WJ; Lee, WI; 電子物理學系; 友訊交大聯合研發中心; Department of Electrophysics; D Link NCTU Joint Res Ctr
1-Jul-1999Mg-related deep levels in AlInPWu, YR; Sung, WJ; Lee, SC; Li, TJ; Lee, WI; 電子物理學系; 友訊交大聯合研發中心; Department of Electrophysics; D Link NCTU Joint Res Ctr
15-Jun-2000Phosphorus vacancy as a deep level in AlInP layersSung, WJ; Wu, YR; Lee, SC; Wen, TC; Li, TJ; Chang, JT; Lee, WI; 友訊交大聯合研發中心; D Link NCTU Joint Res Ctr
Showing results 1 to 5 of 5