瀏覽 的方式： 作者 You, JW
顯示 1 到 3 筆資料，總共 3 筆
| 公開日期 | 標題 | 作者 |
| 1-九月-2005 | Excess low-frequency noise in ultrathin oxide n-MOSFETs arising from valence-band electron tunneling | Wu, JW; You, JW; Ma, HC; Cheng, CC; Hsu, CF; Chang, CS; Huang, GW; Wang, TH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2005 | Low frequency noise degradation in ultra-thin oxide (I5A) analog n-MOSFETs resulting from valence-band tunneling | Wu, JW; You, JW; Ma, HC; Cheng, CC; Hsu, C; Huang, GW; Chang, CS; Wang, T; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 22-十一月-2004 | Valence-band tunneling induced low frequency noise in ultrathin oxide (15 angstrom) n-type metal-oxide-semiconductor field effect transistors | Wu, JW; You, JW; Ma, HC; Cheng, CC; Chang, CS; Huang, GW; Wang, T; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
