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Showing results 1 to 3 of 3
Issue Date
Title
Author(s)
1-Jun-1999
A new quasi-2-D model for hot-carrier band-to-band tunneling current
You, KF
;
Wu, CY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-Jan-1998
A new simulation model for plasma ashing process-induced oxide degradation in MOSFET
You, KF
;
Chang, MC
;
Wu, CY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-May-1996
A novel two-step etching process for reducing plasma-induced oxide damage
You, KF
;
Wu, CY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
