專利侵害責任範圍因果關係的合理詮釋與再建構

Full metadata record

DC Field	Value	Language
dc.contributor.author	沈宗倫	en_US
dc.contributor.author	Shen, Chung-lun	en_US
dc.date.accessioned	2014-12-19T03:51:07Z	-
dc.date.available	2014-12-19T03:51:07Z	-
dc.date.issued	2011	en_US
dc.identifier.issn	1811-3095	en_US
dc.identifier.uri	http://hdl.handle.net/11536/107623	-
dc.identifier.uri	http://www.itl.nctu.edu.tw/tlr_n/ch/list8_1.html	en_US
dc.subject	專利損害賠償	zh_TW
dc.subject	相當因果關係	zh_TW
dc.subject	完全市場價值法則	zh_TW
dc.subject	等同權利金	zh_TW
dc.subject	不當得利	zh_TW
dc.subject	Patent damage	zh_TW
dc.subject	Causation	zh_TW
dc.subject	The entire market value rule	zh_TW
dc.subject	Equivalent royalty	zh_TW
dc.subject	Unjust enrichment	zh_TW
dc.title	專利侵害責任範圍因果關係的合理詮釋與再建構	zh_TW
dc.identifier.journal	科技法學評論	zh_TW
dc.citation.volume	8	en_US
dc.citation.issue	1	en_US
dc.citation.spage	1	en_US
dc.citation.epage	56	en_US
dc.contributor.department	科技法律研究所	zh_TW
dc.contributor.department	Institute of Technology Law	en_US
Appears in Collections:	Technology Law Review

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