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dc.contributor.authorChang, Kow-Mingen_US
dc.contributor.authorChen, Bwo-Ningen_US
dc.contributor.authorHuang, Shih-Mingen_US
dc.date.accessioned2014-12-08T15:16:13Z-
dc.date.available2014-12-08T15:16:13Z-
dc.date.issued2007en_US
dc.identifier.isbn978-1-4244-1891-6en_US
dc.identifier.urihttp://hdl.handle.net/11536/12045-
dc.language.isoen_USen_US
dc.titleThe effects of plasma treatment on the thermal stability of HfAlOx thin filmsen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2007 INTERNATIONAL SEMICONDUCTOR DEVICE RESEARCH SYMPOSIUM, VOLS 1 AND 2en_US
dc.citation.spage181en_US
dc.citation.epage182en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000255857100092-
Appears in Collections:Conferences Paper