Spatially resolving the degradation of SPC thin-film transistors under AC stress

Title:	Spatially resolving the degradation of SPC thin-film transistors under AC stress
Authors:	Chang, Kai-Hsiang Lee, Ming-Hsien Lin, Horng-Chih Huang, Tiao-Yuan Lee, Yao-Jen 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
Issue Date:	2007
URI:	http://hdl.handle.net/11536/12056
ISBN:	978-1-4244-1891-6
Journal:	2007 INTERNATIONAL SEMICONDUCTOR DEVICE RESEARCH SYMPOSIUM, VOLS 1 AND 2
Begin Page:	246
End Page:	247
Appears in Collections:	Conferences Paper