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dc.contributor.authorLiu, Chia-Jyien_US
dc.contributor.authorBhaskar, Ankamen_US
dc.contributor.authorYuan, J. J.en_US
dc.contributor.authorYang, Zong-Renen_US
dc.contributor.authorChen, Shih-Showen_US
dc.contributor.authorChen, Huang-Chinen_US
dc.contributor.authorLiao, Fan-Weien_US
dc.contributor.authorLin, Yu Tingen_US
dc.contributor.authorYeh, Ping Hungen_US
dc.contributor.authorLai, Chun-Yenen_US
dc.contributor.authorChang, Ching-Linen_US
dc.date.accessioned2016-03-28T00:04:23Z-
dc.date.available2016-03-28T00:04:23Z-
dc.date.issued2016-02-15en_US
dc.identifier.issn0272-8842en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.ceramint.2015.11.076en_US
dc.identifier.urihttp://hdl.handle.net/11536/129631-
dc.description.abstractWe report electrical resistivity, thermopower and Ca K-, Mn L-2,L-3- and O K-edges x-ray absorption near edge structure (XANES) studies on CaMn1-xSixO3-delta with x=0, 0.02, and 0.05. The transport properties measurements indicate that the sample of x=0.02 has the lowest electrical resistivity compared to the samples of x=0 and 0.05. Meanwhile, the temperature dependence of thermopower behaves significantly different for samples of x=0.02 and 0.05. These unusual phenomena are elucidated based on the charge transfer equilibrium principle together with the XANES results, which show that the Si substitution for Mn appears to generate an electron doping effect and lattice distortion. Among the samples, CaMn0.98Si0.02O3-delta exhibits the highest figure of merit of 0.0128 at 300 K. This value represents an improvement of about 52% compared to pristine CaMnO3-delta. (C) 2015 Elsevier Ltd and Techna Group S.r.l. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectSinteringen_US
dc.subjectElectron microscopyen_US
dc.subjectElectrical conductivityen_US
dc.subjectThermal propertiesen_US
dc.subjectThermal conductivityen_US
dc.titleThermoelectric property and x-ray absorption near edge structure studies on Si-doped CaMnO3-deltaen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.ceramint.2015.11.076en_US
dc.identifier.journalCERAMICS INTERNATIONALen_US
dc.citation.volume42en_US
dc.citation.spage4048en_US
dc.citation.epage4053en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000369190900039en_US
dc.citation.woscount0en_US
Appears in Collections:Articles