Title: Effects of channel width on electrical characteristics of polysilicon TFTs with multiple nanowire channels
Authors: Wu, YC
Chang, TC
Liu, PT
Chen, CS
Tu, CH
Zan, HW
Tai, YH
Chang, CY
電子工程學系及電子研究所
光電工程學系
Department of Electronics Engineering and Institute of Electronics
Department of Photonics
Keywords: lightly doped drain (LDD);nanowire;polysilicon;thin-film transistor (TFT)
Issue Date: 1-Oct-2005
Abstract: This brief studies the electrical characteristics of a series of polysilicon thin-film transistors (poly-Si TFTs) with different numbers of multiple channels of various widths, with lightly doped drain (LDD) structures. The nanoscale TFT with ten 67-nm-wide split channels (M10) has superior and more uniform electrical characteristics than other TFTs. Additionally, experimental results reveal that the electrical performance of proposed TFTs enhances with each channel width decreasing, yielding a profile from a single-gate to tri-gate structure.
URI: http://dx.doi.org/10.1109/TED.2005.856797
http://hdl.handle.net/11536/13185
ISSN: 0018-9383
DOI: 10.1109/TED.2005.856797
Journal: IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume: 52
Issue: 10
Begin Page: 2343
End Page: 2346
Appears in Collections:Articles


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