Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique

Title:	Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique
Authors:	Chang, MF Chiou, LY Wen, KA 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
Issue Date:	21-Jul-2005
Abstract:	A dynamic bitline shielding (DBS) technique is proposed for highspeed via-programming ROMs, to eliminate code-pattem-dependent crosstalk-induced read failure (CIRF) and increase code-pattem coverage. Fabricated 256 Kb conventional and DBS ROMs demonstrated that the DBS technique can eliminate the CIRF and operate with a small sensing margin.
URI:	http://dx.doi.org/10.1049/el:20051738 http://hdl.handle.net/11536/13476
ISSN:	0013-5194
DOI:	10.1049/el:20051738
Journal:	ELECTRONICS LETTERS
Volume:	41
Issue:	15
Begin Page:	834
End Page:	835
Appears in Collections:	Articles

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