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dc.contributor.authorScardi, P.en_US
dc.contributor.authorErmrich, M.en_US
dc.contributor.authorFitch, A.en_US
dc.contributor.authorHuang, E-Wenen_US
dc.contributor.authorJardin, R.en_US
dc.contributor.authorKuzel, R.en_US
dc.contributor.authorLeineweber, A.en_US
dc.contributor.authorMendoza Cuevas, A.en_US
dc.contributor.authorMisture, S. T.en_US
dc.contributor.authorRebuffi, L.en_US
dc.contributor.authorSchimpf, Christianen_US
dc.date.accessioned2018-08-21T05:53:44Z-
dc.date.available2018-08-21T05:53:44Z-
dc.date.issued2018-06-01en_US
dc.identifier.issn1600-5767en_US
dc.identifier.urihttp://dx.doi.org/10.1107/S1600576718005411en_US
dc.identifier.urihttp://hdl.handle.net/11536/145089-
dc.description.abstractSeparation of size and strain effects on diffraction line profiles has been studied in a round robin involving laboratory instruments and synchrotron radiation beamlines operating with different radiation, optics, detectors and experimental configurations. The studied sample, an extensively ball milled iron alloy powder, provides an ideal test case, as domain size broadening and strain broadening are of comparable size. The high energy available at some synchrotron radiation beamlines provides the best conditions for an accurate analysis of the line profiles, as the size-strain separation clearly benefits from a large number of Bragg peaks in the pattern; high counts, reliable intensity values in low-absorption conditions, smooth background and data collection at different temperatures also support the possibility to include diffuse scattering in the analysis, for the most reliable assessment of the line broadening effect. However, results of the round robin show that good quality information on domain size distribution and microstrain can also be obtained using standard laboratory equipment, even when patterns include relatively few Bragg peaks, provided that the data are of good quality in terms of high counts and low and smooth background.en_US
dc.language.isoen_USen_US
dc.subjectline profile analysisen_US
dc.subjectpowder diffractionen_US
dc.subjectmicrostrainen_US
dc.subjectcrystalline domain sizeen_US
dc.titleSize-strain separation in diffraction line profile analysisen_US
dc.typeArticleen_US
dc.identifier.doi10.1107/S1600576718005411en_US
dc.identifier.journalJOURNAL OF APPLIED CRYSTALLOGRAPHYen_US
dc.citation.volume51en_US
dc.citation.spage831en_US
dc.citation.epage843en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000434336300029en_US
Appears in Collections:Articles