Title: Angle measurement using total-internal-reflection heterodyne interferometry
Authors: Chiu, MH
Su, DC
光電工程研究所
Institute of EO Enginerring
Keywords: angle measurement;total-internal-reflection effect;heterodyne interferometry
Issue Date: 1-Jun-1997
Abstract: A new optical method for angle measurement based on total-internal-reflection heterodyne interferometry is presented. In this method, heterodyne interferometry is applied to measure the phase difference between s and p polarization states at total internal reflection. This phase difference depends on the angle of incidence. Hence, small-angle measurement can be performed only by evaluating this phase difference. The validity of the method is demonstrated, and it has a measurement range of 10 deg. Its resolution depends on the angle of incidence; the best resolution is 8x10(-5) deg. (C) 1997 Society of Photo-Optical Instrumentation Engineers.
URI: http://dx.doi.org/10.1117/1.601200
http://hdl.handle.net/11536/149542
ISSN: 0091-3286
DOI: 10.1117/1.601200
Journal: OPTICAL ENGINEERING
Volume: 36
Issue: 6
Begin Page: 1750
End Page: 1753
Appears in Collections:Articles


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