Title: | Angle measurement using total-internal-reflection heterodyne interferometry |
Authors: | Chiu, MH Su, DC 光電工程研究所 Institute of EO Enginerring |
Keywords: | angle measurement;total-internal-reflection effect;heterodyne interferometry |
Issue Date: | 1-Jun-1997 |
Abstract: | A new optical method for angle measurement based on total-internal-reflection heterodyne interferometry is presented. In this method, heterodyne interferometry is applied to measure the phase difference between s and p polarization states at total internal reflection. This phase difference depends on the angle of incidence. Hence, small-angle measurement can be performed only by evaluating this phase difference. The validity of the method is demonstrated, and it has a measurement range of 10 deg. Its resolution depends on the angle of incidence; the best resolution is 8x10(-5) deg. (C) 1997 Society of Photo-Optical Instrumentation Engineers. |
URI: | http://dx.doi.org/10.1117/1.601200 http://hdl.handle.net/11536/149542 |
ISSN: | 0091-3286 |
DOI: | 10.1117/1.601200 |
Journal: | OPTICAL ENGINEERING |
Volume: | 36 |
Issue: | 6 |
Begin Page: | 1750 |
End Page: | 1753 |
Appears in Collections: | Articles |
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