| Title: | In Situ Ultrahigh Vacuum Transmission Electron Microscope Investigations of Nanostructures |
| Authors: | Chen, L. J. Wu, W. W. 材料科學與工程學系 Department of Materials Science and Engineering |
| Issue Date: | 1-Jul-2009 |
| URI: | http://dx.doi.org/10.1017/S14319276090959688 http://hdl.handle.net/11536/15392 |
| ISSN: | 1431-9276 |
| DOI: | 10.1017/S14319276090959688 |
| Journal: | MICROSCOPY AND MICROANALYSIS |
| Volume: | 15 |
| Issue: | |
| Begin Page: | 1220 |
| End Page: | 1221 |
| Appears in Collections: | Articles |
- In-situ Ultrahigh Vacuum Transmission Electron Microscope Investigations of Nanostructures / Chen, L. J.;Wu, W. W.
- In situ TEM investigation of dynamical changes of nanostructures / Chen, L. J.;Wu, W. W.
- Nanocone SiGe antireflective thin films fabricated by ultrahigh-vacuum chemical vapor deposition with in situ annealing / Chang, Yuan-Ming;Dai, Ching-Liang;Cheng, Tsung-Chieh;Hsu, Che-Wei
- Effect of nanomechanical and microstructural properties on annealed multilayer Si0.8Ge0.2-Si films / Lin, T. -Y.;Tsai, C. -H.;Yau, W. -H.;Chou, C. -P.
- A solid-state cation exchange reaction to form multiple metal oxide heterostructure nanowires / Chen, Y. H.;Huang, C. W.;Yeh, P. H.;Chen, J. Y.;Lin, T. Y.
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