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dc.contributor.authorLo, Lingen_US
dc.contributor.authorLiu, Chia-Linen_US
dc.contributor.authorLin, Rong-Anen_US
dc.contributor.authorWu, Boen_US
dc.contributor.authorShuai, Hong-Hanen_US
dc.contributor.authorCheng, Wen-Huangen_US
dc.date.accessioned2020-05-05T00:01:59Z-
dc.date.available2020-05-05T00:01:59Z-
dc.date.issued2019-01-01en_US
dc.identifier.isbn978-1-5386-6249-6en_US
dc.identifier.issn1522-4880en_US
dc.identifier.urihttp://hdl.handle.net/11536/154047-
dc.description.abstractAccurate analysis of fashion trends is crucial. However, existing predictive algorithms of fashion popularity are restricted to be feasible on the coarse style level but not a finer item level. That is, they are only predictive in the future popularity of a given type of fashion styles (e.g., Rocker), but cannot be precisely down to a particular outfit look chosen by individuals. This paper thus proposes the first solution directly aimed at predicting the fine-grained fashion popularity of an outfit look by taking social media as the learning source. Particularly, a deep temporal sequence learning framework is developed and the proposed framework is evaluated on a real dataset of 380,000 street fashion images collected from the fashion website lookbook.nu. The experimental results show that our proposed framework outperforms the state-of-the-art approaches, with a relative increase of 11.51% to 27.62% (MSE metric) and 7.02% to 32.61% (CSE metric) in the prediction accuracy.en_US
dc.language.isoen_USen_US
dc.subjectFashionen_US
dc.subjectOutfit Looken_US
dc.subjectPopularity Predictionen_US
dc.subjectDeep Learningen_US
dc.titleDRESSING FOR ATTENTION: OUTFIT BASED FASHION POPULARITY PREDICTIONen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2019 IEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING (ICIP)en_US
dc.citation.spage3222en_US
dc.citation.epage3226en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000521828603072en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper