Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Tai, Y. T. | en_US |
dc.contributor.author | Pearn, W. L. | en_US |
dc.contributor.author | Lee, J. H. | en_US |
dc.date.accessioned | 2014-12-08T15:22:56Z | - |
dc.date.available | 2014-12-08T15:22:56Z | - |
dc.date.issued | 2012 | en_US |
dc.identifier.issn | 0020-7543 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/16166 | - |
dc.description.abstract | Accurate cycle time is an essential planning basis required for many production applications, especially on due date commitments, performance metrics analysing, capacity planning, and scheduling. The re-entrant final testing process is the final stage of the complicated semiconductor manufacturing process. To enhance the ability of quick responses and to achieve better on-time delivery in final testing factories, it is essential to develop an accurate cycle time estimation method. In this paper, we provide a statistical approach to calculate the cycle time for multi-layer semiconductor final testing involving the sum of multiple Weibull-distributed waiting times. In addition, percentiles of the cycle time are obtained which are useful to industrial practitioners for due date commitments satisfying the targeted on-time delivery rate. To demonstrate the applicability of the proposed cycle time estimation model, a real example in a semiconductor final testing factory which is located on the Science-based Industrial Park in Hsinchu, Taiwan, is presented. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | cycle time estimation | en_US |
dc.subject | semiconductor final testing | en_US |
dc.subject | Weibull distribution | en_US |
dc.title | Cycle time estimation for semiconductor final testing processes with Weibull-distributed waiting time | en_US |
dc.type | Article | en_US |
dc.identifier.journal | INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH | en_US |
dc.citation.volume | 50 | en_US |
dc.citation.issue | 2 | en_US |
dc.citation.epage | 581 | en_US |
dc.contributor.department | 工業工程與管理學系 | zh_TW |
dc.contributor.department | Department of Industrial Engineering and Management | en_US |
dc.identifier.wosnumber | WOS:000303582300018 | - |
dc.citation.woscount | 3 | - |
Appears in Collections: | Articles |
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