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dc.contributor.authorHuang, Hsuan-Mingen_US
dc.contributor.authorLi, Yimingen_US
dc.date.accessioned2014-12-08T15:24:05Z-
dc.date.available2014-12-08T15:24:05Z-
dc.date.issued2009en_US
dc.identifier.isbn978-1-4398-1784-1en_US
dc.identifier.urihttp://hdl.handle.net/11536/16746-
dc.description.abstractIn this paper, we implement a systematical method for thin film transistor liquid-crystal display (TFT-LCD) design optimization and sensitivity analysis. Based upon a three-dimensional (3D) field solver, Simulation Program with Integrated Circuit Emphasis (SPICE), and a Design of Experiments, we construct a second-order response surface model (RSM) for the performances of an interested TFT-LCD panel. The constructed RSMs are reduced using a step-wise regression. The adequacy and accuracy using the normal residual plots and their residual of squares are verified. According to the constructed models, we then analyze the sensitivity of the performances by considering the design parameters as changing factors (i.e., the size variation, position shift and driving setting) under an assumption of Gaussian distribution. We also could apply the models to optimize the designed circuit. The designing parameters of these models are selected and optimized to fit the designing target of the examined circuit by the genetic algorithm in our unified optimization framework. This computational statistics method can predict the TFT-LCD performances and show the engineering practicability in display panel industry.en_US
dc.language.isoen_USen_US
dc.subjectthin film transistoren_US
dc.subjectliquid-crystal displayen_US
dc.subjectsensitivity analysisen_US
dc.subjectdesign optimizationen_US
dc.subjectresponse surface modelen_US
dc.subjectDesign of Experimentsen_US
dc.subjectmodeling and simulationen_US
dc.titleParameterized Display Performances Behavioral Modeling and Optimization for TFT-LCD Panelen_US
dc.typeProceedings Paperen_US
dc.identifier.journalNANOTECH CONFERENCE & EXPO 2009, VOL 3, TECHNICAL PROCEEDINGSen_US
dc.citation.spage379en_US
dc.citation.epage382en_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000273331000096-
Appears in Collections:Conferences Paper