Title: ESD protection design for 900-MHz RF receiver with 8-kV HBM ESD robustness
Authors: Ker, MD
Lo, WY
Lee, CM
Chen, CP
Kao, HS
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Issue Date: 1-Jan-2002
Abstract: This paper presents a state-of-art ESD protection design for RF circuit with a human-body-model (HBAP ESD robustness of 8kV. By including a turn-on efficient power-rails clamp circuit into the RF circuit, the ESD clamp devices of the RF input pin are operated in the forward-biased conduction, rather than the traditional junction breakdown condition Therefore, the dimension of ESD devices for the RF input pin can be further downsized to reduce the input capacitance loading for the RF signal This design has been successfully applied in a 900-MHz RF receiver and fabricated in 0.25-mum CMOS process with a thick top metal layer. The experimental results have confirmed that its ESD robustness is as high as >8kV under the HBM ESD test.
URI: http://hdl.handle.net/11536/18834
ISBN: 0-7803-7246-8
ISSN: 1529-2517
Journal: 2002 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERS
Volume: 
Issue: 
Begin Page: 427
End Page: 430
Appears in Collections:Conferences Paper