A fast and sensitive built-in current sensor for IDDQ testing

標題:	A fast and sensitive built-in current sensor for IDDQ testing
作者:	Lu, CW Lee, CL Chen, JE 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
公開日期:	1996
URI:	http://hdl.handle.net/11536/19867
ISBN:	0-8186-7655-8
期刊:	1996 IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS
起始頁:	56
結束頁:	58
顯示於類別：	Conferences Paper