Capability measures for processes with multiple characteristics

Abstract

Process capability indices, such as C-p, C-a, and C-pk, have been widely used in the manufacturing industry providing numerical measures on process precision, process accuracy, and process performance. Capability measures for processes with a single characteristic have been investigated extensively. However, capability measures for processes with multiple characteristics are comparatively neglected In this paper, we consider a generalization of the yield index S-pk proposed by Boyles, for processes with multiple characteristics. We establish a relationship between the generalization and the process yield. We also develop a control chart based on the proposed generalization, which displays all the characteristic measures in one single chart. Using the chart, the engineers can effectively monitor and control the performance of all process characteristics simultaneously. Copyright (C) 2003 John Wiley Sons, Ltd.