Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | CHIOU, BS | en_US |
dc.contributor.author | CHUNG, MC | en_US |
dc.date.accessioned | 2014-12-08T15:04:37Z | - |
dc.date.available | 2014-12-08T15:04:37Z | - |
dc.date.issued | 1993-03-01 | en_US |
dc.identifier.issn | 0957-4522 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/3106 | - |
dc.description.abstract | The electrical behaviour of xwt% MnO2-(100-x)(95 wt% ZnO-5 wt% Bi2O3) is investigated. Addition of MnO2 retards grain growth in the ZnO-Bi2O3 system. It is observed that the MnO2 dopant decreases the leakage current, while it increases the non-linearity coefficient and the grain boundary resistance of ZnO-Bi2O3 ceramics. In addition, the noise spectrum of MnO2-doped ZnO-Bi2O3 deviates from 1/f behaviour. The deviation is, however, less enhanced for samples with more MnO2 dopant. | en_US |
dc.language.iso | en_US | en_US |
dc.title | ELECTRICAL BEHAVIOR OF THE MNO2-DOPED ZNO-BI2O3 SYSTEM | en_US |
dc.type | Article | en_US |
dc.identifier.journal | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | en_US |
dc.citation.volume | 4 | en_US |
dc.citation.issue | 1 | en_US |
dc.citation.spage | 38 | en_US |
dc.citation.epage | 42 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:A1993KU66400003 | - |
dc.citation.woscount | 1 | - |
Appears in Collections: | Articles |