Evaluation of spatial Green's functions for microstrips: fast Hankel transform algorithm and complex image method

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DC Field	Value	Language
dc.contributor.author	Hsieh, RC	en_US
dc.contributor.author	Kuo, JT	en_US
dc.date.accessioned	2014-12-08T15:49:05Z	-
dc.date.available	2014-12-08T15:49:05Z	-
dc.date.issued	1998-05-28	en_US
dc.identifier.issn	0013-5194	en_US
dc.identifier.uri	http://hdl.handle.net/11536/32613	-
dc.description.abstract	The fast Hankel transform (FI-IT) algorithm and complex image method (CIM) are employed to evaluate the spatial-domain Green's function for a multilayered microstrip structure. The results are compared with those obtained by exact numerical integration. It is found that both techniques have high efficiency and the FHT has better accuracy than the CIM.	en_US
dc.language.iso	en_US	en_US
dc.title	Evaluation of spatial Green's functions for microstrips: fast Hankel transform algorithm and complex image method	en_US
dc.type	Article	en_US
dc.identifier.journal	ELECTRONICS LETTERS	en_US
dc.citation.volume	34	en_US
dc.citation.issue	11	en_US
dc.citation.spage	1110	en_US
dc.citation.epage	1111	en_US
dc.contributor.department	電信工程研究所	zh_TW
dc.contributor.department	Institute of Communications Engineering	en_US
dc.identifier.wosnumber	WOS:000074370900053	-
dc.citation.woscount	3	-
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