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dc.contributor.author林建志en_US
dc.contributor.authorChien-Chih Linen_US
dc.contributor.author王豐堅en_US
dc.contributor.authorFeng-Jian Wangen_US
dc.date.accessioned2014-12-12T01:19:15Z-
dc.date.available2014-12-12T01:19:15Z-
dc.date.issued2008en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT009555585en_US
dc.identifier.urihttp://hdl.handle.net/11536/39537-
dc.description.abstract工作流程是由一組系統化組成的工作,經過特定的順序執行之後,能夠達成所要的目標或是產品。其中資料是實作和執行工作流程不可或缺的元素。然而工作流程可能會因為不適當的資料操作而產生預期外的結果,例如,遺失執行所需的資料或是收到多份同名資料產生衝突等等。因此在設計流程的過程中,資料分析結果便能提供相關的幫助。這篇論文提出了一個流程模組去描述一個Well-formed工作流程,這一名叫DCDC Model的模組顯示出四類的資料使用異常。因此我們提出了一些漸進式的演算法去偵測出這些資料使用異常,以輔助使用者在工作流程之編輯。zh_TW
dc.description.abstractWorkflow is a set of tasks which are systematized to achieve certain business goal(s), complete where each task is executed in a particular order under automatic control. Artifacts, collections of data items, are necessary for workflow implementation and support process execution. However, a workflow may yield unexpected results in execution due to improper artifact manipulation; e.g. activities miss artifact, or artifact conflict occurs at an activity in run time. Therefore, the analyses on artifact usage in design phase are very important. This thesis presents a process model, named DCDC model, to describe a well-formed workflow. There are four types of artifact usage anomalies in DCDC identified. To help the edit of a process, the corresponding incremental algorithms are presented to detect these anomalies. Their time complexities are also studied.en_US
dc.language.isoen_USen_US
dc.subject工作流程zh_TW
dc.subject商業流程zh_TW
dc.subject控制流zh_TW
dc.subject資料zh_TW
dc.subject資料流zh_TW
dc.subject遞增分析zh_TW
dc.subject異常zh_TW
dc.subjectwork flowen_US
dc.subjectbusiness processen_US
dc.subjectcontrol flowen_US
dc.subjectartifacten_US
dc.subjectartifact flowen_US
dc.subjectincremental analysisen_US
dc.subjectanomaliesen_US
dc.title運用DCDC Model來遞增性分析高階程式之異常使用zh_TW
dc.titleDetecting Artifact Usage Anomalies in High-level Software Incrementally with DCDC Modelen_US
dc.typeThesisen_US
dc.contributor.department資訊科學與工程研究所zh_TW
Appears in Collections:Thesis


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