标题: 以双闸极多晶矽薄膜电晶体作为酸硷感测器之研究
A Study of Novel Double-Gated Poly-Si Thin Film Transistor Based Structure as a pH-ISFET Device
作者: 唐明慈
Tang, Ming-Tsyr
赵天生
Chao, Tien-Sheng
电子物理系所
关键字: 酸硷感测器;双闸极;多晶矽电晶体;ISFET;Double-gate;pH sensing;poly-Si TFT
公开日期: 2011
摘要: 随着生物医学半导体技术的发展进步,许多研究开始探讨将双闸极结构应用在可量测酸硷值的离子感测器上,但是这些研究都使用单晶矽作为双闸极离子感测器的载子通道,而非多晶矽的载子通道。我们首先提出采用新颖的双闸极多晶矽薄膜电晶体结构作为可量测酸硷值的离子感测器,并以二氧化矽薄膜作为离子感测膜之材料。
在本篇论文中,我们探讨在双闸极多晶矽离子感测器拥有不同离子感测膜之厚度时对于上方液态参考电极以及下方底部闸极的酸硷敏感度之影响。在这里我们成功的验证了采用双闸极多晶矽薄膜电晶体结构作为可量测酸硷值的离子感测器之可行性。此外,在扫动液态参考电极和底部闸极电压的操作条件下所得到之酸硷敏感度之相关性也在此篇研究中被观察到并加以诠释。
从实验结果可得到,当双闸极离子感测器经过一道氢气热退火制程后,酸硷敏感度会得到一定程度的提升。同时,我们可以发现将离子感测器浸泡在渗透水中并不会提升酸硷敏感度,但却可以提供一个排除掉不理想效应像是漂移效应(Drift)等,因而拥有较稳定的酸硷量测环境。最重要的是,藉由双闸极离子感测器的上方闸极氧化层以及下方闸极氧化层厚度之不对称性,因而造成受到酸硷值改变时的底部闸极电压变化之影响也被观察到并加以探讨。随着离子感测膜厚度的上升,在扫动底部闸极电压的操作条件下所得到之酸硷敏感度将会逐渐衰退,同时在扫动液态参考闸极电压下的酸硷敏感度则会固定定值,并将被能斯特定律所限制。再者,我们提出了一种量测方法来以此验证在扫动底部闸极和液态参考闸极此两种操作条件下时,所得到的酸硷敏感度之间的相关性。因此我们确信在此篇论文中的实验结果是可信并具有参考价值的。
As the development of the biomedical semiconductor technology, the double-gated structure applied on pH sensing of ISFET has been researched in several studies. However, all the researches of double-gated ISFET above were based on single crystalline silicon channel rather than poly-Si channel film. For the first time, we proposed the novel double-gated poly-crystalline silicon thin film transistors (DG poly-Si TFT) structure as a ion-sensitive filed effect transistor (pH-ISFET) for pH sensing, and adopted silicon-dioxide (SiO2) as the sensing membrane.
In this thesis, we investigated on the pH sensitivity of the liquid-gate and bottom-gate by utilizing a DG poly-Si TFT with various sensing membrane thickness as a pH-ISFET. Here we have successfully demonstrated the feasibility of applying the DG poly-Si TFT as a pH-ISFET. Besides, the relationship between the pH sensitivity of the liquid-gate and bottom-gate operation mode were also observed and illustrated in this study.
From the experiment results, the pH sensitivity of the DG-ISFET is obviously improved after a H2 sinter process. Also, it can be found that the immersion of ISFET devices with the RO water is not expected to improve the pH sensitivity of ISFET but may provide a more stable measurement of pH sensitivity precluding the influence of the non-ideal phenomena such as drift. Most importantly, the pH-induced bottom-gate voltage shift per pH depending on the asymmetric between the top oxide and back oxide thickness of double-gated ISFET is observed and presented. The pH sensitivity of bottom-gate operation mode will degenerate with the increased sensing membrane thickness, while the pH sensitivity of the liquid-gate operation mode is independent of the sensing membrane thickness and limited by the Nernst limit. Furthermore, a measuring method was raised to confirm the relation between the pH response of the bottom-gate and liquid-gate operation mode. Hence we believed that the experiment results in this thesis are credible and valuable.
URI: http://140.113.39.130/cdrfb3/record/nctu/#GT079921517
http://hdl.handle.net/11536/49712
显示于类别:Thesis