Title: A novel hybrid MCDM approach for outsourcing vendor selection: A case study for a semiconductor company in Taiwan
Authors: Lin, Ya-Ti
Lin, Chia-Li
Yu, Hsiao-Cheng
Tzeng, Gwo-Hshiung
科技管理研究所
Institute of Management of Technology
Keywords: Outsourcing;Vendor selection;Multiple criteria decision making (MCDM);Analytic Network Process (ANP)
Issue Date: 1-Jul-2010
Abstract: Outsourcing manufacturing is a trend in today's global business operations. Vendor selection is an essential factor affecting outsourcing operations performance and has been determined as a multiple criteria decision making (MCDM) problem. The purpose of this paper is to propose a novel hybrid MCDM technique to cope with the complex and interactive vendor evaluation and selection problem which can determine the structural relationships and the interrelationships amongst all the evaluation's dimensions and support the Analytic Network Process (ANP) method to arrange appropriate weightings to each dimension and criterion in the evaluation model by summarizing the opinions of the experts. Finally, the overall performance ranking of all alternatives can be obtained to assist the decision making. Taiwan semiconductor industry is the largest provider in worldwide market. It is vertically disintegrated and outsourcing is a main stream practice. Wafer-testing is a critical manufacturing step in the semiconductor supply chain that distinguishes whether the IC can meet the specifications. Consequently, it's crucial to establish a thorough model for selecting the wafer-testing vendors in order to achieve the success of the outsourcing operation. A case study of a Taiwan semiconductor company in selecting its wafer-testing outsourcing vendor by using the proposed MCDM technique is demonstrated to enhance the decision making quality. The results and proposed solution can be referred to by not only the semiconductor companies, but also other industries so that they can improve the vendor selection process in order to achieve a higher performance and satisfaction level. (C) 2009 Elsevier Ltd. All rights reserved.
URI: http://dx.doi.org/10.1016/j.eswa.2009.12.036
http://hdl.handle.net/11536/5194
ISSN: 0957-4174
DOI: 10.1016/j.eswa.2009.12.036
Journal: EXPERT SYSTEMS WITH APPLICATIONS
Volume: 37
Issue: 7
Begin Page: 4796
End Page: 4804
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