| Title: | 奈米CMOS元件量子效應與電荷傳輸模擬及電性與可靠性分析(III) Nano-CMOS Charge Ballistic Transport, Quantum Effect, Characterization, and Reliability Study(III) |
| Authors: | 汪大暉 WANG TAHUI 交通大學電子工程系 |
| Issue Date: | 2006 |
| Gov't Doc #: | NSC95-2221-E009-271 |
| URI: | http://hdl.handle.net/11536/89738 https://www.grb.gov.tw/search/planDetail?id=1309492&docId=241985 |
| Appears in Collections: | Research Plans |
