| Title: | 奈米CMOS元件量子效應與電荷傳輸模擬及電性與可靠性分析(II) Nano-CMOS Charge Ballistic Transport, Quantum Effect, Characterization, and Reliability Study(II) |
| Authors: | 汪大暉 WANG TAHUI 交通大學電子工程系 |
| Issue Date: | 2005 |
| Gov't Doc #: | NSC94-2215-E009-009 |
| URI: | http://hdl.handle.net/11536/89962 https://www.grb.gov.tw/search/planDetail?id=1143851&docId=219368 |
| Appears in Collections: | Research Plans |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.
