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dc.contributor.author陈卫国en_US
dc.contributor.authorWEI-KUOCHENen_US
dc.date.accessioned2014-12-13T10:38:59Z-
dc.date.available2014-12-13T10:38:59Z-
dc.date.issued1996en_US
dc.identifier.govdocNSC85-2112-M009-047zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/95936-
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=223293&docId=40032en_US
dc.description.sponsorship行政院国家科学委员会zh_TW
dc.language.isozh_TWen_US
dc.title三五族氮化合物半导体薄膜之物理特性---子计画二:GaN类半导体材料及物理结构之光性研究(I)zh_TW
dc.titlePhysical Property Studies of III-V Semiconductor Nitride Films---Optical Property Studies of GaN-Based Semiconductor Materials and Structures (I)en_US
dc.typePlanen_US
dc.contributor.department国立交通大学电子物理学系zh_TW
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