| Title: | 0.85 微米面射型雷射可靠度與雜訊品質之研究 Reliability Studies and Noise Measurement of 0.85.mu.m Surface Emitting Lasers |
| Authors: | 戴國仇 國立交通大學光電工程研究所 |
| Issue Date: | 1995 |
| Gov't Doc #: | NSC84-2215-E009-035 |
| URI: | http://hdl.handle.net/11536/96435 https://www.grb.gov.tw/search/planDetail?id=172350&docId=29298 |
| Appears in Collections: | Research Plans |
- RELIABILITY STUDIES OF 0.85 MU-M VERTICAL-CAVITY SURFACE-EMITTING LASERS - 50000-H MTTF AT 25-DEGREES-C / WU, CC;TAI, K;HAUNG, KF
- RELIABILITY STUDIES OF GAIN-GUIDED 0.85 MU-M GAAS/ALGAAS QUANTUM-WELL SURFACE-EMITTING LASERS / WU, CC;TAI, K;HUANG, TC;HUANG, KF
- Failure and degradation mechanisms of high-power white light emitting diodes / Yang, Shih-Chun;Lin, Pang;Wang, Chien-Ping;Huang, Sheng Bang;Chen, Chiu-Ling
- 垂直共振腔面射型雷射二極體之研製及可靠度研究 / 吳昌成;戴國仇, 張俊彥
- GaSb-based mid infrared photonic crystal surface emitting lasers / Pan, Chien Hung;Lin, Chien Hung;Chang, Ting Yuan;Lu, Tien Chang;Lee, Chien Ping
- Photonic Crystal Surface Emitting Lasers With Quantum Dot Active Region / Chen, Tzu-Shan;Li, Zong-Lin;Hsu, Ming-Yang;Lin, Gray;Lin, Sheng-Di
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