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Issue DateTitleAuthor(s)
2011Bipolar resistive switching characteristics of Gd2O3 thin film structureChang, K. M.; Tzeng, W. H.; Liu, K. C.; Chan, Y. C.; Kuo, C. C.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-2010Excellent combination of strength and ductility in an Fe-9Al-28Mn-1.8C alloyChang, K. M.; Chao, C. G.; Liu, T. F.; 材料科學與工程學系; Department of Materials Science and Engineering
1-Mar-2011Field Dependence of Porous Low-k Dielectric Breakdown as Revealed by the Effects of Line Edge Roughness on Failure DistributionsLee, S. C.; Oates, A. S.; Chang, K. M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010Flow Rate's Influence on Low Temperature Silicon Oxide Deposited by Atmospheric Pressure Plasma Jet for Organic Thin Film Transistor ApplicationChang, K. M.; Huang, S. S.; Cheng, C. H.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010Modulation of the Electrical Characteristics of HfOx/TiN RRAM Devices through the Top Electrode MetalChang, K. M.; Tzeng, W. H.; Liu, K. C.; Lai, W. R.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 1 to 5 of 5