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Showing results 1 to 10 of 10
Issue DateTitleAuthor(s)
1-Jun-2005Bistable resistive switching of a sputter-deposited Cr-doped SrZrO3 memory filmLiu, CY; Wu, PH; Wang, A; Jang, WY; Young, JC; Chiu, KY; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-2002Characterization and Modeling of on-chip spiral inductors for Si RFICsChao, CJ; Wong, SC; Kao, CH; Chen, MJ; Leu, LY; Chiu, KY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Aug-1997Effects of floating-gate doping concentration on flash cell performanceHuang, TY; Jong, FC; Lin, HC; Chao, TS; Leu, LY; Young, K; Lin, CH; Chiu, KY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-1997Improved flash cell performance by N2O annealing of interpoly oxideJong, FC; Huang, TY; Chao, TS; Lin, HC; Leu, LY; Young, K; Lin, CH; Chiu, KY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-1998Improving radiation hardness of EEPROM/flash cell by N2O annealingHuang, TY; Jong, FC; Chao, TS; Lin, HC; Leu, LY; Young, K; Lin, CH; Chiu, KY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Lane detection using color-based segmentationChiu, KY; Lin, SF; 電控工程研究所; Institute of Electrical and Control Engineering
3-Jan-2006Memory effect of sol-gel derived V-doped SrZrO3 thin filmsLiu, CY; Chuang, CC; Chen, JS; Wang, A; Jang, WY; Young, JC; Chiu, KY; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2000New insights on RF CMOS stability related to bias, scaling, and temperatureSu, JG; Wong, SC; Chang, CY; Chiu, KY; Huang, TY; Ou, CT; Kao, CH; Chao, CJ; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-1997A study on the radiation hardness of flash cell with horn-shaped floating-gateHuang, TY; Jong, FC; Chao, TS; Lin, HC; Leu, LY; Young, K; Lin, CH; Chiu, KY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-1997A study on the radiation hardness of flash cell with horn-shaped floating-gateHuang, TY; Jong, FC; Chao, TS; Lin, HC; Leu, LY; Young, K; Lin, CH; Chiu, KY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 1 to 10 of 10