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Browsing by Author Goto, K.

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Issue DateTitleAuthor(s)
2007Accurate modeling and characterization of mobility in tensile and compressive stress for state-of-the-art manufacturing NMOSFETsWang, J. -S.; Chen, William P. N.; Shih, C. -H.; Lien, C.; Su, Pin; Sheu, Y. M.; Chao, Donald Y. -S.; Goto, K.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-2008Impact of process-induced strain on Coulomb scattering mobility in short-channel n-MOSFETsChen, William P. N.; Su, Pin; Goto, K.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2006A new series resistance and mobility extraction method by BSIM model for nano-scale MOSFETsChen, William P. N.; Su, P.; Wang, J. S.; Lien, C. H.; Chang, C. H.; Goto, K.; Diaz, C. H.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 1 to 3 of 3