Browsing by Author Oates, A. S.
Showing results 1 to 4 of 4
| Issue Date | Title | Author(s) |
| 2007 | A comprehensive model for plasma damage enhanced transistor reliability degradation | Weng, W. T.; Oates, A. S.; Huang, Tiao-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-Mar-2011 | Field Dependence of Porous Low-k Dielectric Breakdown as Revealed by the Effects of Line Edge Roughness on Failure Distributions | Lee, S. C.; Oates, A. S.; Chang, K. M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2009 | FUNDAMENTAL UNDERSTANDING OF POROUS LOW-K DIELECTRIC BREAKDOWN | Lee, Shou-Chung; Oates, A. S.; Chang, Kow-Ming; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2008 | Limitation of low-k reliability due to dielectric breakdown at vias | Lee, Shou-Chung; Oates, A. S.; Chang, Kow Ming; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
