瀏覽 的方式： 作者 Tseng, WD
顯示 1 到 5 筆資料，總共 5 筆
| 公開日期 | 標題 | 作者 |
| 1-四月-2000 | Fault coverage and defect level estimation models for partially testable MCMs | Tseng, WD; Wang, K; 資訊工程學系; Department of Computer Science |
| 1997 | Fault coverage estimation model for partially testable multichip modules | Tseng, WD; Wang, KC; 資訊工程學系; Department of Computer Science |
| 1996 | Fuzzy-based circuit partitioning in built-in current testing | Tseng, WD; Wang, KC; 交大名義發表; 資訊工程學系; National Chiao Tung University; Department of Computer Science |
| 1-三月-1999 | Fuzzy-based CMOS circuit partitioning in built-in current testing | Tseng, WD; Wang, KC; 資訊工程學系; Department of Computer Science |
| 1996 | Testable design and testing of MCMs based on multifrequency scan | Tseng, WD; Wang, KC; 資訊工程學系; Department of Computer Science |
