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公開日期標題作者
1-四月-2000Fault coverage and defect level estimation models for partially testable MCMsTseng, WD; Wang, K; 資訊工程學系; Department of Computer Science
1997Fault coverage estimation model for partially testable multichip modulesTseng, WD; Wang, KC; 資訊工程學系; Department of Computer Science
1996Fuzzy-based circuit partitioning in built-in current testingTseng, WD; Wang, KC; 交大名義發表; 資訊工程學系; National Chiao Tung University; Department of Computer Science
1-三月-1999Fuzzy-based CMOS circuit partitioning in built-in current testingTseng, WD; Wang, KC; 資訊工程學系; Department of Computer Science
1996Testable design and testing of MCMs based on multifrequency scanTseng, WD; Wang, KC; 資訊工程學系; Department of Computer Science
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