Title: | Crosstalk-insensitive via-programming ROMs using content-aware design framework |
Authors: | Chang, MF Chiou, LY Wen, KA 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
Keywords: | code patterns;crosstalk;read only memory (ROM) |
Issue Date: | 1-Jun-2006 |
Abstract: | Various code patterns of a via-programming read only memory (ROM) cause significant fluctuations in coupling noise between, bitlines (BLs). This crosstalk between BLs leads to read failure in high-speed via-programmable ROMs and limits the coverage of applicable code patterns. This work presents a content-aware design framework (CADF) for via-programming ROMs to overcome the crosstalk induced read failure. The CADF ROMs employ a content-aware structure and correspondent code-structure programming algorithm to reduce the amount of coupling noise source while maintaining nonminimal BL load for crosstalk reduction. A 256-Kb conventional ROM and a 256-Kb CADF ROM were fabricated using a 0.25-mu m logic CMOS process. The measured results ascertain that the read induced read failure is suppressed significantly by CADF. The CADF ROM also reduced 86.2% and 94.5% in power consumption and standby current compared to the conventional ROM, respectively. |
URI: | http://dx.doi.org/10.1109/TCSII.2006.873640 http://hdl.handle.net/11536/12223 |
ISSN: | 1057-7130 |
DOI: | 10.1109/TCSII.2006.873640 |
Journal: | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS |
Volume: | 53 |
Issue: | 6 |
Begin Page: | 443 |
End Page: | 447 |
Appears in Collections: | Articles |
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