Title: An MPCN-Based BCH Codec Architecture With Arbitrary Error Correcting Capability
Authors: Yang, Chi-Heng
Lin, Yi-Min
Chang, Hsie-Chia
Lee, Chen-Yi
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Keywords: Bose-Chaudhuri-Hocquenghem (BCH) codes;encoder;error correcting codes (ECC);NAND flash;syndrome
Issue Date: 1-Jul-2015
Abstract: This paper presents an area-efficient architecture of arbitrary error correction Bose-Chaudhuri-Hocquenghem codec for NAND flash memory. By factorizing the generator polynomial into several minimal polynomials and utilizing linear feedback shift registers based on minimal polynomials, our reconfigurable design cannot only support multiple error correcting capabilities at a few extra cost, but also merge the encoder and syndrome calculator for efficiently reducing hardware complexity. After being implemented in CMOS 65-nm technology, the test chip supporting t = 1-24 bits can achieve 1.33-Gb/s measured throughput with 73k gate-count while another design supporting t = 60-84 bits can provide 1.60-Gb/s synthesized throughput with 168.6k gate-count.
URI: http://dx.doi.org/10.1109/TVLSI.2014.2338309
http://hdl.handle.net/11536/127873
ISSN: 1063-8210
DOI: 10.1109/TVLSI.2014.2338309
Journal: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
Volume: 23
Begin Page: 1235
End Page: 1244
Appears in Collections:Articles