Title: | Effects of thermal stabilities for the ultra thin chromium layers applied on (Ba,Sr)TiO3 thin films |
Authors: | Kuo, MW Shye, DC Chiou, BS Chen, JS Cheng, HC 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
Keywords: | BST (77.84.-s);thermal stability (68.60.Dv);dielectric property (77.55.+f) |
Issue Date: | 2004 |
Abstract: | This work reports the temperature-electric properties for the (Ba,Sr)TiO3(BST) thin film capacitor using the multi-film structure of BST/ultra-thin-chromium(Cr) layer/BST. The BST(200 nm)/Cr(1-3 nm)/BST(200 nm) multi-films reveal excellent properties in the thermal stabilities of dielectric property, low leakage current and less power dissipation. |
URI: | http://hdl.handle.net/11536/27161 http://dx.doi.org/10.1080/10584580490459224 |
ISSN: | 1058-4587 |
DOI: | 10.1080/10584580490459224 |
Journal: | INTEGRATED FERROELECTRICS |
Volume: | 61 |
Begin Page: | 183 |
End Page: | 187 |
Appears in Collections: | Conferences Paper |
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