Title: | A note on the Poor-Verdu upper bound for the channel reliability function |
Authors: | Alajaji, F Chen, PN Rached, Z 電信工程研究所 Institute of Communications Engineering |
Keywords: | arbitrary channels with memory;binary erasure channels (BECs);channel coding;channel reliability function;information spectrum;probability of error |
Issue Date: | 1-Jan-2002 |
Abstract: | In an earlier work, Poor and Verdu established an upper bound for the reliability function of arbitrary single-user discrete-time channels with memory. They also conjectured that their bound is tight for all coding rates. In this note, we demonstrate via a counterexample involving memoryless binary erasure channels (BECs) that the Poor-Verdu upper bound is not tight at low rates. We conclude by examining possible improvements to this bound. |
URI: | http://dx.doi.org/10.1109/18.971761 http://hdl.handle.net/11536/29086 |
ISSN: | 0018-9448 |
DOI: | 10.1109/18.971761 |
Journal: | IEEE TRANSACTIONS ON INFORMATION THEORY |
Volume: | 48 |
Issue: | 1 |
Begin Page: | 309 |
End Page: | 313 |
Appears in Collections: | Conferences Paper |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.