統計資料
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| Plasma charging damage and water-related hot-carrier reliability in the deposition of plasma-enhanced tetraethylorthosilicate oxide | 109 |
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| Plasma charging damage and water-related hot-carrier reliability in the deposition of plasma-enhanced tetraethylorthosilicate oxide | 0 | 0 | 0 | 0 | 0 | 0 | 1 |
檔案下載
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| A1997XM56700059.pdf | 23 |
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